Font Size: 

The following paper presents the method of obtaining silicon nanocrystals in a matrix of zirconium dioxide and results of measurements of electrical properties. The tested material was produced by alternating vacuum evaporation with SiO_x and ZrO₂, and then annealed to obtain silicon nanocrystals. The measurement parameters in the function of temperature and frequency were: capacitance, resistance, angle of phase shift and tangent of dielectric losses. On this basis, and referring to the dimensions of the sample, conductivity was determined as a function of temperature and frequency. Thanks to this, the mechanism of charge transfer and the nature of the material have been proposed.